北極光科技

M470 電化學掃瞄系統 精選

最佳化 - 電化學掃瞄系統

 

 The M470 establishes a new standard in achieving the perfect balance of scan speed, resolution and accuracy to deliver the gold standard in spatially resolved electrochemical measurement. The M470 is the 4th generation of scanning probe instrumentation from Uniscan Instruments and introduces a new range of systems with higher specifications and additional probe techniques.

 

  • Scanning Electrochemical Microscopy (SECM)
  • Intermittent Contact Scanning Electrochemical Microscopy (ic-SECM)
  • Alternating Current Scanning Electrochemical Microscopy (ac-SECM)
  • Scanning Vibrating Electrode (SVET)
  • Scanning Kelvin Probe (SKP)
  • Localised Impedance Spectroscopy (LEIS)
  • Scanning Droplet System (SDS)
  • Alternating Current Scanning Droplet System (ac-SDS)
  • Non-contact Surface Profiling (OSP)

The Model 470 Scanning Electrochemical Workstation is the most advanced and easiest to use Scanning Probe Electrochemistry System. It has been designed for ultra-high resolution spatially resolved electrochemical available in the widest range of user configurations.
The system is available with a combination of nine techniques which make the 470 the world’s most flexible probe electrochemistry platform.
The fast precise closed loop positioning system designed specifically for the demands of Scanning Probe Electrochemistry with nanometer resolution combined with Uniscan’s unique hybrid 32 bit DAC technology enables the user to select the configuration most suited to their experiments.
A choice of 7 modules, 3 different cells, wide range of probes, long working distance video camera option, post processing data analysis software options.

  • 掃描範圍: (x,y,z) 100 mm x 100 mm x 100 mm
  • 最大掃描速率: 10 mm/s
  • 解析度: (x, y, z) 20 nm

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